System and method for balancing delay of signal communication paths through well voltage adjustment

ABSTRACT

A method of balancing signal interconnect path delays between an analog domain and a digital domain of an integrated circuit includes applying a test signal to a selected one of a plurality of communication paths between the analog domain and the digital domain. A rising edge delay and a falling edge delay of the test signal is equalized by adjusting a body bias voltage of a delay element configured within the selected communication path. A rising edge delay and a falling edge delay for each of the remaining communication paths is compared with the equalized rising edge delay and falling edge delay of the selected communication path, and a body bias voltage for one or more of a plurality of delay elements configured within each of the remaining communication paths is adjusted until corresponding rising and falling edge delays thereof match the equalized rising edge delay and falling edge delay of the selected communication path.

BACKGROUND

The present invention relates generally to computer system delayelements, and, more particularly, to a system and method for balancingdelay of signal communication paths through well voltage adjustment.

As technology continues to advance at an unprecedented rate, thetransfer of information or data has remained a high priority. Inaddition, as processing speeds continue to increase, the speed at whichinformation is transferred remains key in increasing overall systemspeed. Traditionally, parallel busses or cables have been coupledbetween multiple devices to transfer information during a processingfunction. However, certain problems that may degrade the transferreddata (such as signal loss when transmitted over long distances) have ledto improvements in the manner in which such data is transferred. Inaddition, the multitude of wires or cables necessary for parallelconnection may become cumbersome, especially in larger systems. In thepast, however, alternatives to parallel connections often led toinformation bottlenecks, leaving parallel lines as the only viablechoice.

As the need for bandwidth expands in both existing networks and thosenow being developed, serial backplanes (or busses) have become anadvantageous alternative for solving these problems. Typically, serialbackplanes employ a serializer at a transmitting end to convert andtransmit data in serial order and a deserializer at a receiving end toconvert the data back to parallel form once received. Such high-speedserializer/deserializer (SERDES) receivers have become the benchmark forasynchronous communication and have provided clear advantages overparallel busses. For example, SERDES receivers include transmitters andreceivers, and use simplified wiring harnesses (often only a single wireper channel) that typically consume less power than theirparallel-coupled counterparts. Higher performance may also be achievedbecause SERDES receivers reduce the cross talk that often occurs betweenparallel wires. In addition, SERDES receivers may be employed totransmit data over long distances without the signal degradationexperienced with parallel busses, thus ultimately offering increasedreliability and fidelity over parallel busses.

SERDES receivers and transmitters generally classified as mixed-signaldevices are comprised of an analog function domain, a digital functiondomain and a parallel communication path between the analog and digitalfunction domains. The analog domain operates to transmit and receivedata over a physical medium or cable, as well as convert between serialand parallel data at high speed, while the digital domain pre or postprocesses data. Reliable operation of the SERDES device at high speed isdependent not only on the function of the analog and digital domains,but on the parallel communication path that connects these domains. As aresult, delay matching of all data path segments that make up theparallel path is required.

Conventionally, the matching of parallel data paths between analog anddigital domains has been implemented by using a combination of FETsizing and physical placement techniques in order to reduce the effectof process variance from path to path. However, such methods typicallyresult in the use of larger devices and/or restrictions on the locationthereof, both of which hamper physical implementation and can impactcircuit speed. Additionally, these techniques do not fully canceldevice-to-device variations that can grow, as a percentage of drawndevice size, with advancing technologies.

The overall performance of an analog/digital design depends, in part,upon the ability to maintain the synchronous tracking of the twodomains. Due to broad process variations, and without some means ofbetter adjusting the delays between the two domains, maximum potentialperformance may not be obtained. Moreover, if the two domains do nottrack with one another over temperature and time, the tolerance of theoverall system will be further reduced. Accordingly, an improved meansof real time adjustment of the communication paths between the domainsis desirable.

SUMMARY

The foregoing discussed drawbacks and deficiencies of the prior art areovercome or alleviated by a method of balancing signal interconnect pathdelays between an analog domain and a digital domain of an integratedcircuit. In an exemplary embodiment, the method includes applying a testsignal to a selected one of a plurality of communication paths betweenthe analog domain and the digital domain. A rising edge delay and afalling edge delay of the test signal is equalized by adjusting a bodybias voltage of a delay element configured within the selectedcommunication path. A rising edge delay and a falling edge delay foreach of the remaining communication paths is compared with the equalizedrising edge delay and falling edge delay of the selected communicationpath, and a body bias voltage for one or more of a plurality of delayelements configured within each of the remaining communication paths isadjusted until corresponding rising and falling edge delays thereofmatch the equalized rising edge delay and falling edge delay of theselected communication path.

In another embodiment, a system for balancing signal interconnect pathdelays between an analog domain and a digital domain of an integratedcircuit includes a plurality of communication paths between the analogdomain and the digital domain, each of the plurality of communicationpaths including a tunable delay element therein, with a selected one ofsaid communication paths configured for the application of a test signaltherethrough. The system further includes a means for equalizing arising edge delay and a falling edge delay of the test signal byadjustment of a body bias voltage of a corresponding one of the tunabledelay elements within the selected communication path. A means isprovided for comparing a rising edge delay and a falling edge delay foreach of the remaining of the plurality of communication paths with theequalized rising edge delay and falling edge delay of said selectedcommunication path, in addition to a means for adjusting a body biasvoltage for one or more of the tunable delay elements within each of theremaining of the plurality of communication paths until correspondingrising and falling edge delays thereof match the equalized rising edgedelay and falling edge delay of the selected communication path.

In still another embodiment, a method of balancing a plurality ofcommunication path delays between an analog domain and a digital domainof an integrated circuit includes setting nominal tuning values for eachof a plurality of delay elements within the plurality of parallelcommunication paths. The delay element for a first of the plurality ofcommunication paths is tuned until a rising edge delay of a first testsignal sent through the delay element for the first communication pathequals a falling edge delay of a second test signal through the delayelement for the first communication path. The remaining delay elementsfor the remaining communication paths are tuned so as to match theequalized rising edge delay and falling edge delay of the delay elementfor the first communication path.

BRIEF DESCRIPTION OF THE DRAWINGS

Referring to the exemplary drawings wherein like elements are numberedalike in the several Figures:

FIG. 1 is a schematic block diagram of an existing system having amultiplicity of parallel communication paths between an analog domainand a digital domain;

FIG. 2 is a schematic block diagram of a system, wherein each of themultiplicity of parallel communication paths between the analog domainand the digital domain is provided with an independently tunable delayelement, in accordance with an embodiment of the invention;

FIG. 3(a) is an exemplary a single stage (inverting) CMOS element thatmay be used as a tunable delay element in the system of FIG. 2;

FIG. 3(b) is an exemplary a multiple stage (non-inverting) CMOS elementthat may also be used as a tunable delay element in the system of FIG.2;

FIG. 4 is a schematic diagram of an exemplary system that may beconfigured for implementing the balancing of delays within multipleparallel communication paths, in accordance with a further embodiment ofthe invention; and

FIG. 5 is a flow diagram illustrating an exemplary methodology forimplementing delay path adjustment, in accordance with a furtherembodiment of the invention.

DETAILED DESCRIPTION

Disclosed herein is a system and method for balancing delay of signalcommunication paths through well voltage adjustment. Briefly stated, thepresent invention embodiments are configured to actively balance aplurality of signal interconnect path delays between an analog and adigital domain of an integrated circuit by balancing the rising andfalling delays of a first of the interconnect paths through body biasvoltage adjustment of a delay element within the first interconnectpath. The rising and falling delays of the remaining interconnect pathsare then adjusted after subsequent comparison to the balanced rising andfalling delays of the first interconnect path.

Referring initially to FIG. 1, there is shown a schematic block diagramof an existing system 100 having a multiplicity of parallelcommunication paths 102 between an analog domain 104 and a digitaldomain 106. As indicated above, the matching of transferred paralleldata from the analog domain 104 to the digital domain 106 has previouslybeen implemented by using a combination of FET sizing and physicalplacement techniques.

Therefore, in accordance with an embodiment of the invention, FIG. 2 isa schematic block diagram of a system 200, wherein each of themultiplicity of parallel communication paths 102 between the analogdomain 104 and the digital domain 106 is provided with an independentlytunable delay element 202, the adjustment of which is discussed infurther detail hereinafter. Each tunable delay element 202 may include,for example, a single stage CMOS element (inverting) as shown in FIG.3(a) or, alternatively, a multistage CMOS element (non-inverting) asshown in FIG. 3(b). In still another embodiment, a parallel delay firststage structure may be used to separate rising delay (RDLY) and fallingdelay (FDLY) tuning, in conjunction with a second combining stage.Regardless of the physical implementation of the tunable delay elements202, the tuning thereof is carried out by adjustment of the body biasvoltage provided to each FET therein.

FIG. 4 is a schematic diagram of an exemplary system 400 that may beconfigured for implementing the balancing of delays within multipleparallel communication paths (denoted hereinafter as Paths 0 through N).As is shown, the system 400 employs a means of launching data througheach of the paths 102 in a test mode, in addition to a means ofcapturing the data as it exits the path 102 in the test mode.Furthermore, the system 400 utilizes a means of varying the capture timeof data, as well as a means of analyzing the path output as compared toan absolute or relative value of arrival time and thereafter makingupdated adjustments for body bias values in order to converge the delayof one propagation and/or path relative to another.

More specifically, FIG. 4 includes a set of multiplexers 402 forswitching the operation of the parallel data paths 102 from a normaloperating mode to a test or calibration mode. The calibration of thedelay element 202 for the first path (Path 0) is somewhat different fromthe calibration of the delay elements 202 for the remaining paths (Paths1-N), as will become more apparent later. However, within eachcalibration (test) path, there is included a test data launch latch 404placed on the source side of the communication path 102 (serving as thesecond input source to corresponding multiplexer 402), and a datacapture latch 406 on the sink side of the communication path 102. Thelaunching of the test data in each of the launch latches 404 iscontrolled by a test clock signal 408, while the receipt of the testdata in each of the capture latches 406 is controlled by a strobe clocksignal 410, which is tied to the tuning of the first delay element inPath 0.

With regard to calibration of the first delay path (Path 0), a tappeddelay unit 412 is used to provide a plurality of discrete, accuratedelays, an individual one of which is selectable by multiplexer 414. Theoutput of multiplexer 414 is the strobe clock signal 410. The particulardelay selected from tapped delay unit 412 is compared with the delay oftest data sent through the calibration path in Path 0, for both risingedge data and falling edge data to see whether the two delays are thesame. If not, body bias voltages of the Path 0 delay element 202 areadjusted until RDLY of Path 0 equals FDLY of Path 0.

For example, to test a rising edge delay, initial data values of “1” and“0” are stored in the launch latch 404 and the capture latch 406,respectively. When the test clock launches the “1” data from launchlatch 404 to Path 0, the selected strobe clock signal 410 signalgenerated by the tapped delay unit 412 is simultaneously sent to thecapture latch 406. If the selected delay associated with the tappeddelay unit 412 is faster than the time taken for the test “1” data totravel through delay Path 0, then the rising edge data change will notbe triggered into the capture latch 406. A logic state machine 416 isthen used to select the next slowest value of delay from the tappeddelay unit 412 and the process is repeated. Eventually, a value of delayfrom the tapped delay unit 412 will be selected such that the launched“1” data is present at the capture latch 406 by the time the strobeclock signal 410 is received. This will then cause the “0” datainitially stored in capture latch 406 to change to “1” data.

Once the specific RDLY of Path 0 is established, the system 400 isfurther configured to determine the falling edge delay of Path 0 to seeif it is the same as RDLY. This time, “0” data is initially stored inlaunch latch 404, while “1” data is initially stored in capture latch406. A similar process is used to determine (beginning at the quickestvalue of tapped delay) which value of tapped delay finally results inthe data changing from “1” to “0” in the capture latch 406. The resultsof the determined FDLY are compared with the determined RDLY, and ifthey are not the same, the system 400 will implement an adjustment ofthe body bias of the delay elements of the tunable delay path 0. Once abody bias adjustment is made, the system 400 will allow the RDLY andFDLY determination sequences to be repeated until such time as RDLYequals FDLY for tunable delay path 0. The logic state machine 416records the selected value of the tapped delay unit 412 for which RDLYand FDLY are equivalent to one another for Path 0.

Tuning of the remaining delay paths (Path 1-N) is then implemented bycomparison to the equalized delay values for Path 0. Accordingly, acalibration sequence is next performed for the RDLY and FDLY of Path 1.However, rather than changing the body bias of the delay elements forthe purpose of equating RDLY and FDLY in Path 1 to one another, the bodybiasing for Paths 1-N is adjusted until they are in agreement with Path0. In other words, rising and falling data is launched through tunabledelay test path 1, using the set values for the strobe clock signal 410determined for Path 0.

At this point, it should be noted that adjustment of the body biasvoltages for the various delay elements are may be implemented in anymanner known to one skilled in the art, such as through a voltagereference source, a voltage reference multiplier and a voltage dividerstack, for example.

Finally, FIG. 5 is a flow diagram illustrating an exemplary methodology500 for implementing delay path adjustment, and which may be carriedout, for example, through the use of parallel interface system 400. Inan exemplary embodiment, the methodology 500 is launched uponpower-on/reset (POR) of the system, as shown at block 502. However, themethodology 500 may be executed or re-executed during other periods ofoperation, such as during functionally idle periods for example. In thismanner, the parallel interface system may maintain a tight delaytolerance while in an operational mode.

Once launched, the methodology 500 reads various functional interfaceparameters, as shown at block 504, before implementing a firstsubprocess section 506 thereof, in which the performance and tuningranges of the parallel data paths are initially set in order to meetfunctional requirements. For example, as shown in block 508, variousnominal tuning values are selected and set, such as initial body biasvoltage values. In this regard, an initial setting for the body biasvalues of the path delay elements may be set at about a midpoint of thecapable adjustment range thereof. Furthermore, the initial delay of eachof the paths is tested to make sure the delay is not “too small” so asto prevent the ability to tune the same.

More specifically, at block 510, data is placed and verified in thecapture latches 406 (FIG. 4) for each path at a maximum clock delay.Then, at block 512, the opposite data is launched to see whether it iscaptured at the minimum clock delay setting of the tapped delay unit412. If it is determined at decision block 514 that the data has beencaptured at this minimum setting, this is indicative that the delaythrough the associated data path is too small (i.e., the performance ofthe data path is faster than is needed). In this case, the initialsettings of the delay element(s) are tuned to increase the overalldelay, as shown at block 516. The initial tuning process is repeateduntil data is not captured by using the minimum setting of the tappeddelay unit 412.

The next subprocess section 518 of methodology 500 implements the tuningof the first delay path, in a manner similar to that discussed inconjunction with the exemplary system 400 of FIG. 4. That is, the delayelements in Path 0 are tuned until RDLY equals FDLY. Proceeding to block520, the specific tap settings for the tapped delay unit 412 that“bracket” the capture/no capture of the test data in the capture latch406 (either rising edge or falling edge) are determined. Then, at block522, the opposite data is passed through Path 0 to see if the same tapsettings “bracket” the opposite edge data. If this is not the case, asdetermined at decision block 524, then the performance (i.e., body biassettings) of Path 0 is adjusted in an attempt to equate RDLY to FDLY, asshown in block 526. The process then returns to block 520 to repeat thesequence until RDLY finally equals FDLY, at which time the tap settingsare recorded as shown at block 528.

The testing of the remaining paths is outlined in subprocess section530, beginning at block 532. As indicated earlier, both the rising andfalling edge delays of remaining Paths 1-N are not specifically comparedwith one another, but are instead adjusted to match the RDLY and FDLY ofPath 0. Thus, at decision block 534, if the tap settings that establishthe RDLY/FDLY for the given path do not match the saved tap settings forPath 0, the process advances to block 536 for body bias adjustment ofthe particular delay path under test. Once the tap settings for theRDLY/FDLY of the path under test match the saved settings for Path 0,then the process determines at decision block 538 whether all remainingpaths have been tested. If not, the process returns to block 532.Otherwise, the initial tuning of each delay path has been completed.Finally, process 500 optionally includes block 540, which causes theentire sequence to be re-run upon detection of another power-on/resetcondition, a change in environmental condition or other system failurefor example.

It will be appreciated that in addition to the exemplary systemarchitecture 400 and methodology 500 described above, additionalfeatures may also be implemented for tuning the delay paths. Forexample, the architecture 400 may incorporate learning cycles so thatthe N times methodology flow latency may be included in the total runtime of the hardware. Thus, even in non-idle portions of the hardware,the architecture can assume a portion of the available functionalbandwidth to insert a learning cycle. Furthermore, a third mode may beadded within the structure, adding latches, or using a portion of thelearning structure latches to monitor the performance of the system intowhich the delay path balancing system is incorporated for indicationsthat timing tolerance between the two domains have decreased due toshifts in temperature, voltage or other in-situ stresses. Shoulddegradation of timing tolerances be indicated and functional failurebecomes a possibility, a re-calibration methodology flow could beinjected to re-optimize the parallel data path well biases for the newin-situ conditions.

While the invention has been described with reference to a preferredembodiment or embodiments, it will be understood by those skilled in theart that various changes may be made and equivalents may be substitutedfor elements thereof without departing from the scope of the invention.In addition, many modifications may be made to adapt a particularsituation or material to the teachings of the invention withoutdeparting from the essential scope thereof. Therefore, it is intendedthat the invention not be limited to the particular embodiment disclosedas the best mode contemplated for carrying out this invention, but thatthe invention will include all embodiments falling within the scope ofthe appended claims.

1. A method of balancing signal interconnect path delays between ananalog domain and a digital domain of an integrated circuit, the methodcomprising: applying a test signal to a selected one of a plurality ofcommunication paths between the analog domain and the digital domain;equalizing a rising edge delay and a falling edge delay of said testsignal by adjusting a body bias voltage of a delay element configuredwithin said selected communication path; comparing a rising edge delayand a falling edge delay for each of the remaining of said plurality ofcommunication paths with said equalized rising edge delay and fallingedge delay of said selected communication path; and adjusting a bodybias voltage for one or more of a plurality of delay elements configuredwithin each of the remaining of said plurality of communication pathsuntil corresponding rising and falling edge delays thereof match saidequalized rising edge delay and falling edge delay of said selectedcommunication path.
 2. The method of claim 1, further comprisingutilizing a selected value of a tapped delay unit to determine saidrising edge and said falling edge delays of said test signal.
 3. Themethod of claim 2, wherein said selected value of said tapped delay unitis used as a strobe clock signal for capturing data of said test signal,said data launched from a launch latch to a capture latch.
 4. The methodof claim 3, wherein said equalized rising edge delay and falling edgedelay of said selected communication path is stored in a logic statemachine by recording bracketed values of said tapped delay unit, saidbracketed values comprising a last value of said tapped delay unit thatdoes not result in capturing data of said test signal at said capturelatch, and a first value of said tapped delay unit that does result incapturing data of said test signal at said capture latch.
 5. The methodof claim 4, wherein said rising and falling edge delays of saidremaining communication paths are matched to said equalized rising edgedelay and falling edge delay of said selected communication path byutilizing said recorded bracketed values of said tapped delay unit.
 6. Asystem for balancing signal interconnect path delays between an analogdomain and a digital domain of an integrated circuit, comprising: aplurality of communication paths between the analog domain and thedigital domain, each of said plurality of communication paths includinga tunable delay element therein, with a selected one of saidcommunication paths configured for the application of a test signaltherethrough; means for equalizing a rising edge delay and a fallingedge delay of said test signal by adjustment of a body bias voltage of acorresponding one of said tunable delay elements within said selectedcommunication path; means for comparing a rising edge delay and afalling edge delay for each of the remaining of said plurality ofcommunication paths with the equalized rising edge delay and fallingedge delay of said selected communication path; and means for adjustinga body bias voltage for one or more of said tunable delay elementswithin each of the remaining of said plurality of communication pathsuntil corresponding rising and falling edge delays thereof match saidequalized rising edge delay and falling edge delay of said selectedcommunication path.
 7. The system of claim 6, further comprising atapped delay unit configured to generate a plurality individual delayvalues, wherein a selected value thereof is utilized to determine saidrising edge and said falling edge delays of said test signal.
 8. Thesystem of claim 7, wherein said selected value of said tapped delay unitis used as a strobe clock signal for capturing data of said test signal,said data launched from a launch latch to a capture latch.
 9. The systemof claim 8, further comprising a logic state machine, said logic statemachine configured for recording bracketed values of said tapped delayunit, said bracketed values comprising a last value of said tapped delayunit that does not result in capturing data of said test signal at saidcapture latch, and a first value of said tapped delay unit that doesresult in capturing data of said test signal at said capture latch. 10.The system of claim 9, wherein said rising and falling edge delays ofsaid remaining communication paths are matched to said equalized risingedge delay and falling edge delay of said selected communication path byutilizing said recorded bracketed values of said tapped delay unit. 11.A method of balancing a plurality of communication path delays betweenan analog domain and a digital domain of an integrated circuit, themethod comprising: setting nominal tuning values for each of a pluralityof delay elements within the plurality of parallel communication paths;tuning the delay element for a first of the plurality of communicationpaths until a rising edge delay of a first test signal sent through thedelay element for the first communication path equals a falling edgedelay of a second test signal through the delay element for the firstcommunication path; and tuning the remaining delay elements for theremaining communication paths so as to match the equalized rising edgedelay and falling edge delay of the delay element for the firstcommunication path.
 12. The method of claim 11, wherein said tuning thedelay element for a first of the plurality of communication paths, andsaid tuning the remaining delay elements for the remaining communicationpaths comprises adjusting a body bias voltage thereof.
 13. The method ofclaim 12, further comprising utilizing a selected value of a tappeddelay unit to determine said rising edge and said falling edge delays ofthe delay element for the first communication path.
 14. The method ofclaim 13, wherein the equalized rising edge delay and falling edge delayof the first communication path is stored in a logic state machine byrecording bracketed values of said tapped delay unit, said bracketedvalues comprising a last value of said tapped delay unit that does notresult in capturing data of said first and seconds test signals at acapture latch, and a first value of said tapped delay unit that doesresult in capturing data of said first and second test signal at saidcapture latch.
 15. The method of claim 14, wherein said rising andfalling edge delays of said remaining communication paths are matched tosaid equalized rising edge delay and falling edge delay of said selectedcommunication path by utilizing said recorded bracketed values of saidtapped delay unit.
 16. The method of claim 13, wherein said settingnominal tuning values for each of the plurality of delay elementsfurther comprises using a minimum value of said tapped delay unit as astrobe clock signal to determine whether test data sent through theplurality delay elements is captured.
 17. The method of claim 16,wherein a given one or more of said plurality of delay elements isadjusted whenever said test data sent through the plurality delayelements is captured using said minimum value of said tapped delay unitas a strobe clock signal.